(1)求每个芯片智能检测不达标的概率;
(2)人工抽检30个芯片,记恰有1个不达标的概率为,求的极大值点;
(3)若芯片的合格率不超过,则需对生产工序进行改良.以(2)中确定的作为p的值,判断该企业是否需对生产工序进行改良.
同类型试题
y = sin x, x∈R, y∈[–1,1],周期为2π,函数图像以 x = (π/2) + kπ 为对称轴
y = arcsin x, x∈[–1,1], y∈[–π/2,π/2]
sin x = 0 ←→ arcsin x = 0
sin x = 1/2 ←→ arcsin x = π/6
sin x = √2/2 ←→ arcsin x = π/4
sin x = 1 ←→ arcsin x = π/2
y = sin x, x∈R, y∈[–1,1],周期为2π,函数图像以 x = (π/2) + kπ 为对称轴
y = arcsin x, x∈[–1,1], y∈[–π/2,π/2]
sin x = 0 ←→ arcsin x = 0
sin x = 1/2 ←→ arcsin x = π/6
sin x = √2/2 ←→ arcsin x = π/4
sin x = 1 ←→ arcsin x = π/2